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Subject of master's degree work: "Reseach in the efficiency of test generation for analog/digital line replaceable units of a specialized radio complex."
Leader: associate professor Zinchenko Y.E.
The abstract of thesis made: Marinets E.N.
| Introduction and ground of actuality of theme |
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At this time practically there are not the systems which provide like the digital testing the
automatic construction of tests for the devices of analogs and analog-to-digital (ATD) on their
structural or behavioral description. The existent systems are called only to help the diagnostician
of high qualification, so that tests are built practically by hand coming from thorough knowledges
of diagnostician about structure and functions of object of diagnostics (OD). Existent problems:
- tests, built by hand, are not effective for the industrial testing of ATD -
devices on an accessible test equipment;
- for adaptation to the new equipment they have to be built anew, and again by hand.
Traditional approach of construction of tests for ATD - devices is based on the functional
testing on the basis of specifications of OD. Thus a diagnostician assumes usually, that
in the process of diagnostics a different control-diagnostic apparatus will be accessible
(CDA). Plenty of specifications, large value of CDA and requirement of high qualification,
offered to the personnel, and also a process over of diagnosing, connected with plenty of
operations by hand, is brought to the low degree of automation and in final analysis to
the high cost of traditional approach. Increase of complication of modern ATD - devices,
it is caused the increase of degree of integration of ÀTD-²Ñ with complication of
co-operation of their analogs and digital knots next to diminishing of correlation of
this complication to the common number of conclusions of ÀTD-²Ñ, substantially multiplies
this problem and compels scientists and practical workers-diagnosticians to search new
approaches of testing of ATD - devices.
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| Purpose and tasks of work |
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The purpose of this work is research of possibility of construction of effective generation
of tests by different methods which will provide effective work of the automated system of
diagnosing, development improved SOFTWARE for the generation of tests, development of method
for research of generation of tests for the chosen disrepairs.
For achieving the put purpose in this work the analysis of problems is used in area of
the analog testing, researches of traditional and modern approaches of testing of ATD are
conducted - devices, description over of principles of work of different methods of generation
is brought.
On the basis of the conducted researches the choice of direction is farther done, a method
is developed and requirements are formulated to design software.
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| Planned practical value |
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Because at the end of 90th there was strong progress in the use of digital charts, the to decision
of problem of diagnostics and testing of charts of analogs was halted, however lately set strong
development of analog-to-digital charts and this problem is becomes very actual, and its decision
will give strong theoretical ground for the improvement of base of ATD-devices and their control
enterprises both their productive and their using.
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Up
| Conclusions |
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At this time the methods of structural synthesis of tests for analog-digital devices and basic works
are practically absent in this direction, as well as in the case of the digital testing, orient
diagnosticians, foremost, on the use of casual and pseudo-random sequences of analogs in connection
with the standard types of signals, such as sinusoid, drank and etc. Therefore on the first stage of
creation of ASD it is necessary to realize exactly this approach to the generation of tests.
SAPR ORCAD and language of description of ATD-device PSpice realized in him
answer all proper requirements and that is why this SAPR can be used as instrumental
SAPR ASD.
Development ON a generation and analysis of tests it is component part for development of base
version of ASD, doing the analysis of all complexes ATD-TEZ.
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| The Literature |
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1. Äàâûäîâ Ï.Ñ. Òåõíè÷åñêàÿ äèàãíîñòèêà ðàäèîýëåêòðîííûõ óñòðîéñòâ è ñèñòåì. - Ã.:
Ðàäèî è ñâÿçü, 1988. - 256 ñ.
2. Agrawal V.D, Bushnell M. L. Essentials of electronic testing for digital,
memory and mixed-signal VLSI circuits . - Boston: Kluwer Academic Publishers, - 2000, 650 p
3. Bapiraju Vinnakota. Analog and mixed-signal test. - Prentice Hall PTR, 1998. - 261p.
4. Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha “Fault Diagnosis of Analog
Integrated Circuits”, Springer, 2005.
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