Dissertation

Intoducting.

Nobody can imagine his life without technics. It bacame an ordinary thing. Sometimes we even don't realize how often we use it, especialy electronics. Unfortunately, it often brakes. For quality and fast repair we need a complex for measuring parameters and seaching faults on it.

The main goal of this work is development and researching the stucture of such complex for measuring and repairing digital-analog and analog circuits. A real prototype of a system is Complex DTM-119/1.

Complex for measuring parameters of microcircuits and devices DMT-119/1

Complex DTM –119/1 is a hardware-software complex, which consists of four analog and sixteen digital channels for measuring parameters of signals, the channel for measuring a signal in a range of frequencies from 100 Hz to 3 GHz, four channels of direct current power supplies and a channel for generating sine wave signals in a range of frequencies from 250 KHz to 3 GHz.

Complex DTM –119/1 is intended for expanding the features of Complex DTM –119 and working with it under control of a PC. Structurally the complex is produced as a case with separate devices installed in it, connected by the GPIB bus in a single measuring complex under control of an external PC.

Complex DTMТ–119/1 is intended for:

• Generating and measurement of analog signals;
• Measurement up to 16 channels of digital signals;
• Supplying of analog signals on measured MC or the measured device;
• Measurement of the MC response or the measured device on the supplied signal;
• Measurement ADC and MC mixed signals parameters (up to 16 digital and 2 analog).
• Measurements spectral and noise parameters of MC’s and devices;
• Automated amplitude-response construction of measured МС ’s and devices;
• Generating and measurement direct current/voltage to a feed measured МС ’s and devices;
• Teamwork with a Complex DTM –119 for measuring analog МС ’s and devices with complex forms of generating and measuring the signals;
• Teamwork with Complex DTM–119 for increasing the number of channels for generating and measuring the signals;
• Teamwork with digital testers during measuring the parameters of DAC, ADC and mixed-signals MC’s.

The basic goals and tasks during incoming inspection with Complex DTM –119 :

• Conducting scientific researches and development. An opportunity of carrying out the analog MC incoming control;
• Analog MC’s behavioral analysis during imitating tests;
• Creation methodological base of revealing failure to prevent wrecks;
• Reduction the methodology of measurements and tests in conformity with modern requirements;

Economic benefit of carrying out the incoming tests:

• Decreasing the number of wrecks;
• Purchase analog МС ’s for ordinary applications and sale already as complete sets for special application or purchase of crystals and packaging them on the own manufacture
• Import-replacement of such services . Charges on these purposes are very significant.

Complex DTM –119 basic parameters :

Owing to the features of Complex DTM –119/1, it provides measuring the following analog MC’s electrical parameters:

• contacting;
• supply current;
• input and output currents and voltages;
• pulse signals target parameters (duration, delay, front duration, cut duration);
• signals amplitude in a specified moments of time;
• amplitude and frequency (period) of sine wave signals;
• signals spectral analysis;
• resistance ranges;
• measured MC’s or devices noise pa rameters;

By means of mathematical processing results of measurements the opportunity of the control is provided:

• amplitude-response and phase-response characteristics;
• gain factor;
• output signal increasing speed:
• difference of voltages and currents values;
• output signal phase-shift;
• other functional characteristics of the tested МС ’s .

Complex DTM –119/1 provides measuring analog МС ’s of the following types:

• operational amplifiers;
• comparators;
• drivers;
• analog switchboards;
• buffer amplifiers;
• analog generators in a range of frequencies up to 500 MHz;
• analog elements of systems AFC and AAC;
• amalgamators;
• attenuators in a range of frequencies up to 3 GHz;
• active and passive filters;
• teamwork with a digital testers – measuring МС ’s and DAC-ADC devices;
• carrying out of incoming/outgoing control of МС ’s , devices and modules with quantity of tested outputs according to quantity of a measurement complex channels.

For each type of МС measured parameters are set according to the declared parameters by manufacturer.

Conclusion.

As we see, systems for diagnostics analog and digital-analog schemes is also needed, as a digital diagnostic systems. This subject is actual therefore our county owns lots of old analog technics.

Literature.

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• Miron Abramovich. Digital system testing and testable design. / New Jersey, US 1990 р , 649 p.

• Article «In-circuit testing is alive and would be», journal „ELECTRONIKA: Science, Technology, Business”, edition 5/2001.

• Technical diagnostic basis. Book 1. Objects models, diagnosis methods and algoriithmes / ed. Parhomenko P.P - Moskow.: Energy,1986. - 464 p.

• Suvorova E.A. Sheynin U.E. Designing digital systems under VHDL. – Petersburg, 2003. – 576 p.

• Grushvitskiy R.I., Mursaev A.X., Ugrumov E.P. Designing systems on programmeble logic chips. - Peterburg, 2002. - 608 p.
• Zinchenko J.J. Anisochronous signature analizators optimal structure synthesis. DonNTU works collection. Series: Informatics, cybernetics and computer engineering, 6th edition. - Donetsk: DonNTU, 1999.- p. 186-191.

• Zinchenko J.J., Kozinets A.M., Julin K.N. Probe-search problems and ways of its solving. Сборник трудов Донецкого государственного технического университета. DonNTU works collection. Series: Informatics, cybernetics and computer engineering, 6th edition. - Donetsk: DonNTU, 1999.- p. 212--217.